1 产品
| 图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Discontinued at Digi-Key | Tape & Reel (TR) | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers |
