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图片 型号 价格 数量 库存 制造商 描述 Series Part Status Packaging Operating Temperature Mounting Type Package / Case Supplier Device Package Supply Voltage Number of Bits Logic Type
SN74BCT8374ADWRE4
获得报价
RFQ
3,317
有现货
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWR
获得报价
RFQ
3,250
有现货
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWRG4
获得报价
RFQ
3,978
有现货
Texas Instruments IC SCAN TEST DEVICE 24SOIC 74BCT Obsolete Tape & Reel (TR) 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADW
单位
$9.64
RFQ
889
有现货
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 74BCT Active Tube 0°C ~ 70°C Surface Mount 24-SOIC (0.295", 7.50mm Width) 24-SOIC 4.5 V ~ 5.5 V 8 Scan Test Device with D-Type Edge-Triggered Flip-Flops