- Part Status :
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20 产品
| 图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
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3,029
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | |||
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|
|
972
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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|
|
2,187
有现货
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | |||
|
|
2,037
有现货
|
Texas Instruments | IC MEMORY DECODER 20SOIC | 74BCT | Active | Tube | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | |||
|
|
|
2,497
有现货
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | |||
|
|
879
有现货
|
Texas Instruments | IC DECODER MEM DUAL 2-4 20-DIP | 74BCT | Active | Tube | 0°C ~ 75°C | Through Hole | 20-DIP (0.300", 7.62mm) | 20-PDIP | 4.5 V ~ 5.5 V | - | Memory Decoder | |||
|
|
获得报价 |
1,666
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
1,188
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
获得报价 |
806
有现货
|
Texas Instruments | IC SCAN TEST DEVICE LATCH 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
获得报价 |
846
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
3,810
有现货
|
Texas Instruments | IC SCAN TEST DEVICE TXRX 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
获得报价 |
2,817
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
2,739
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers | ||
|
|
|
获得报价 |
3,609
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
2,795
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
获得报价 |
3,663
有现货
|
Texas Instruments | IC TRANSCEIVER 1-9BIT 24DIP | 74BCT | Obsolete | Tube | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
2,399
有现货
|
Texas Instruments | IC MEMORY DECODER 20-SOIC | 74BCT | Active | Tube | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC | 4.5 V ~ 5.5 V | - | Memory Decoder | |||
|
|
|
889
有现货
|
Texas Instruments | IC SCAN TEST DEVICE W/FF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | |||
|
|
|
2,326
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Inverting Buffers | |||
|
|
|
2,301
有现货
|
Texas Instruments | IC SCAN TEST DEVICE BUFF 24-SOIC | 74BCT | Active | Tube | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Buffers |
